Index Name

Seed, A.

Similar Names

Seed, Alex;   Seed, Alexander


Baltes, H.;   Barois, P.;   Baylis, L.;   Bowring, N.;   Cady, A.;   Caliebe, W.;   Carboni, C.;   Chaudhuri, B.K.;   Cluzeau, P.;   Dolganov, P.V.;   Ellman, B.;   Furenlid, L.;   Getmanenko, Y.;   Gleeson, H.F.;   Goodby, J.;   Goodby, J.W.;   He, P.;   Herbert, M.R.;   Hird, M.;   Hirst, L.S.;   Huang, C.C.;   Huang, S.;   Johnson, P.M.;   Jákli, Antal;   Kiryanov, A.;   Kundu, S.K.;   Levelut, Anne-Marie;   Lu, Z.;   Mac Lughadha, S.T.;   Mach, P.;   Matkin, L.S.;   Mills, J.T.;   Nassif, L.;   Nene, S.;   Nguyen, H.T.;   Panarin, Yu.P.;   Pindak, R.;   Pitney, J.;   Pollmann, J.;   Roberts, N.;   Robinson, W.K.;   Rosenblatt, C.;   Semyonov, A.N.;   Srajer, G.;   Styring, P.;   Toyne, K.;   Twieg, Robert J.;   Vij, J.K.;   Watson, S.J.;   Xu, H.;   Zhang, S.

Publication Titles

1995: Electro-Optic and Piezo-Optic Studies of an Antiferro-Ferri-Ferro-Electric System
1996: Investigation of the field induced ferrielectric subphases in antiferroelectric liquid crystals
1999: A possible structural model of the SmC.beta.* phase
1999: Structures of chiral smectic-C mesophases revealed by polarization-analyzed resonant x-ray scattering
2000: Optical reflectivity study of synclinic and anticlinic structures in thin freely suspended smectic films
2000: Resonant x-ray scattering at the Se edge in liquid crystal free-standing films and devices
2002: Physical Properties and Reflection Spectra of SMC* Sub-Phases
2002: nterlayer structures of the chiral smectic liquid crystal phases revealed by resonant x-ray scattering
2003: Dielectric relaxation behavior of a liquid crystal showing an unusual type of antiferroelectric-ferroelectric-antiferroelectric phase sequence
2003: Single crystal, liquid crystal, and hybrid organic semiconductors


19th Int. Liq. Cryst. Conf., Edinburgh, 2002, P153
Appl. Phys. Lett., 76, 1863
Eur. Phys. J. E, 3, 7
Liq. Cryst., 26, 1415
Mol. Cryst. Liq. Cryst. A, 263, 69
Mol. Materials, 6, 69
Phys. Rev. E, 60, 6793
Phys. Rev. E, 65, 041705
Phys. Rev. E, 67, 041704
Proc. SPIE-Int. Soc. Opt. Eng., 4991, 212

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