Index Name
Pankratz, S.Co-authors
Bahr, Christian; Cady, A.; Goodby, J.; Goodby, J.W.; Hird, M.; Holyst, R.; Huang, C.C.; Johnson, P.M.; Mach, P.; Nguyen, H.T.; Nguyen, T.; Olson, D.A.; Paulson, A.Publication Titles
1998: Experimental characterization of layer thinning transitions1999: Optical Reflectivity and Ellipsometry Studies of the Sm-C*.alpha. Phase
1999: Thinning transitions in free-standing liquid-crystal films as the successive formation of dislocation loops
2000: Ellipsometric studies of synclinic and anticlinic arrangements in liquid crystal films
2000: High-resolution differential optical reflectivity measurements of freestanding liquid-crystal films
2000: Kinetics of layer-thinning transitions in overheated smectic films
2000: Structure of the Liquid-Crystal Ferrielectric Phases as Determined by Ellipsometry
2001: Optical studies of the smectic-C*a phase layer structure in free-standing films
Sources
Phys. Rev. E, 58, R2721Phys. Rev. E, 60, R2456
Phys. Rev. E, 61, 6689
Phys. Rev. E, 62, 8106
Phys. Rev. E, 63, 061711
Phys. Rev. Lett., 83, 4073
Phys. Rev. Lett., 84, 4870
Rev. Sci. Instrum., 71, 3184
